and form IC connections with a few more process steps with which to test and burn-in before singulating into packaged ICs. Figure 10.1 illustrates the basic differences between today s wafer and IC ...

The maker of wafer-level test and burn-in devices reported earnings for its August quarter yesterday, beating expectations. But more important than reported results was management's commentary ...

We came across a bullish thesis on Aehr Test Systems, Inc. (AEHR) on Ahead of the Curve’s Substack by Ashleigh Day. In this ...

Silicon carbide wafer level burn-in test systems and full wafer contactors are poised to be a key contributor to revenue against this year. But we're also forecasting material bookings and revenue ...