If the product requires wafer level testing, then more hardware is needed. In addition to a manual test rig, I will also have been designing a probe card, which will connect to the ATE head with a ...

Description: Controlled position of a stimulation magnetic source for semiconductor probing. The system manually controls the position of the device under test (DUT), the contact probes, the ...

such as probe cards and connectors. Ensuring consistent probe contact with the wafer is necessary for reliable measurements. “We’ve done a lot of work on the mechanical aspects of our probe cards, ...

Stifel Nicolaus analyst Brian Chin maintained a Hold rating on Formfactor (FORM – Research Report) yesterday and set a price target of ...

Being able to optimize that probe card is the key to getting high yield on the wafer, and we apply a large customer database for a type of application or design. They can utilize our library with ...

The Probe Cards segment consists of technologies and ... The Systems segment consists of analytical probe solutions for on-wafer probing, board tests, and package tests. The company was founded ...

TD Cowen analyst Krish Sankar maintained a Hold rating on Formfactor (FORM – Research Report) today and set a price target of $44.00.

I too did the necessary modifications, which were simply attaching 3 end stops to the CNC and soldering in an otherwise unpopulated connector for the surface probe. Many of the newer machines ...