MPI Probe Card - Leading the Way in Semiconductor Testing
MPI's Probe Card division offers innovative solutions for semiconductor testing, ensuring high performance and reliability in electronic devices.
MPI TS3000 and TS3000-IFE Probe System - MPI Corporation
Incorporating MPI’s IceFreeEnvironment™ the TS3000-IFE accommodates testing with MicroPositioners and / or probe card over a wide temperature range of -60…300°C on up to 300 mm wafers with additional capability for probing on film-frames.
EVS Probe Card - Advanced Wafer Probing Solution - MPI …
The EVS Probe Card is an enhancement over the conventional buckling beam probe card. Key features are higher current carrying capacity (C.C.C.) and lower balanced contact force (BCF), as well as overall MEMS-like characteristics. EVS can …
Cantilever Probe Card - for Gold Bump and Pad Wafer Testing
MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements.
Advanced Semiconductor Test - MPI Corporation
Lead, direct, and manages PC Division North America sales, service, and applications activities, policies, objectives, and initiatives to accomplish Probe Card (PC) Divisional sales target annual booking’s objective.
MPI Manual Probe Stations for Wafer Probing and Testing
MPI TS150, TS200 & TS300 manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 150, 200 and 300mm.
MPI PA Wafer Probers | Wafer Test | Laser Diode Test - MPI …
MPI PA offers a wide range of high-performance wafer probers for the diverse needs of the Photonics, Optoelectronic, Semiconductor, and Laser industries.
MPI TS2000 Series - 200mm Semi Automatic Probe Station - MPI …
Many single probes, low-profile probe card holder for 4.5” x 11” probe card, and lower plate to chuck distance are ideal for simultaneous probing with active probes and makes the system a perfect choice for Design Validation and / or Failure Analysis work.
VEGA Prober Series for Laser Diode & Optical Module Testing
MPI prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.
MPI Fully Automatic Probe Systems
The combined capabilities now offer the customer unequaled measurement flexibility with test automation while significantly reducing the overall cost of test. MPI’s WaferWallet ® also incorporates simple and convenient handling of multiple wafer types and sizes.